Chemistry of inorganic compounds – Zeolite – Structure defined x-ray diffraction pattern
Reexamination Certificate
2010-08-13
2011-12-20
Brunsman, David M (Department: 1732)
Chemistry of inorganic compounds
Zeolite
Structure defined x-ray diffraction pattern
C423S702000, C423S706000, C208S046000, C208S111010, C208S135000
Reexamination Certificate
active
08080234
ABSTRACT:
A method of manufacturing a molecular sieve of the MCM-22 family, said method comprising the steps of (a) providing a mixture comprising at least one source of ions of tetravalent element, at least one source of alkali metal hydroxide, at least one directing-agent (R), water, and optionally at least one source of ions of trivalent element, said mixture having the following mole composition:Y:X2=10 to infinityH2O:Y=1 to 20OH−:Y=0.001 to 2M+:Y=0.001 to 2R:Y=0.001 to 0.34wherein Y is a tetravalent element, X is a trivalent element, M is an alkali metal; (b) treating said mixture at crystallization conditions for less than 72 hr to form a treated mixture having said molecular sieve, wherein said crystallization conditions comprise a temperature in the range of from about 160° C. to about 250° C.; and (c) recovering said molecular sieve.
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Kay Robert Ellis
Lai Wenyih Frank
Brunsman David M
ExxonMobil Chemical Patents Inc.
Tyus D.M.
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