Process for manufacturing integrated circuit with power field ef

Semiconductor device manufacturing: process – Making regenerative-type switching device – Having field effect structure

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438268, 438273, H01L 2133, H01L 21336

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active

056311770

ABSTRACT:
A manufacturing process for an integrated circuit which includes at least one vertical-current-flow MOS transistor. The patterned photoresist which screens the body implant is also used to mask the etching of a nitride layer over a pad oxide. After the photoresist is cleared, the nitride pattern is transferred into the oxide, and the resulting oxide
itride stack is used to mask the source implant. The nitride/oxide stack is then removed, the gate oxide is grown, and the gate layer is then deposited.

REFERENCES:
patent: 4757032 (1988-07-01), Contiero
patent: 4890142 (1989-12-01), Tonnel et al.
patent: 4902636 (1990-02-01), Akiyama et al.
patent: 5055895 (1991-10-01), Akiyama et al.
patent: 5077228 (1991-12-01), Eklund et al.
patent: 5273917 (1993-12-01), Sakurai
patent: 5273922 (1993-12-01), Tsoi
patent: 5306652 (1994-04-01), Kwon et al.
patent: 5376968 (1994-12-01), Yang
patent: 5475273 (1995-12-01), Paparo et al.
Wolf, S., Silicon Processing for the VLSI Era Lattice Press, Sunset Beach, CA, vol. 2, pp. 298-301.

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