Process for manufacturing a vapor phase epitaxial wafer of compo

Metal treatment – Process of modifying or maintaining internal physical... – Chemical-heat removing or burning of metal

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148174, 156612, 219 1049R, 219 1067, 427 87, 427248R, 427299, 118719, H01L 21205, H01L 21302

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active

041689984

ABSTRACT:
Semiconductor epitaxial wafers consisting of an epitaxial film and its substrate can be removed, in accordance with the present invention, from a substrate supporting component, without breaking the wafers into pieces after completion of vapor growth. The carbonaceous powder according to the present invention can greatly and effectively decrease the breaking of wafers, as compared with the conventional SiO.sub.2 or SiC-coated substrate supporting components.

REFERENCES:
patent: 3436255 (1969-04-01), Harris et al.
patent: 3549847 (1970-12-01), Clark et al.
patent: 3796182 (1974-03-01), Rosler
patent: 3845738 (1974-11-01), Berkman et al.
patent: 3980854 (1976-09-01), Berkman et al.
Luther, L. C., "Bulk Growth of GaP by Halogen Vapor Transport", Metallurgical Transactions, vol. 1, Mar. 1970, pp. 593-601.
Goemans et al., "Control of Slip . . . with Profiled Susceptors", J. Crystal Growth, vol. 31, 1975, pp. 308-311.
Burd, J. W., "Multi-Wafer Growth System . . . GaAs.sub.1-x P.sub.x ", Transactions Metallurgical Soc. Aime, vol. 245, Mar. 1969, p. 573.
Shaw, D. W., "Effects of Vapor Composition . . . Gallium Arsenine . . .", J. Electrochem. Soc., Solid State Science, vol. 115, No. 7, Jul. 1968, p. 778.

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