Process for manufacturing a triaxial piezoresistive...

Measuring and testing – Speed – velocity – or acceleration

Reexamination Certificate

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C073S146000, C340S974000

Reexamination Certificate

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07322236

ABSTRACT:
A manufacturing process of a semiconductor piezoresistive accelerometer includes the steps of: providing a wafer of semiconductor material; providing a membrane in the wafer over a cavity; rigidly coupling an inertial mass to the membrane; and providing, in the wafer, piezoresistive transduction elements, that are sensitive to strains of the membrane and generate corresponding electrical signals. The step of coupling is carried out by forming the inertial mass on top of a surface of the membrane opposite to the cavity. The accelerometer is advantageously used in a device for monitoring the pressure of a tire of a vehicle.

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patent: 6763718 (2004-07-01), Waters et al.
patent: 6853315 (2005-02-01), Schiller et al.
patent: 102 50 358 (2004-05-01), None

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