Measuring and testing – Speed – velocity – or acceleration
Reexamination Certificate
2008-01-29
2008-01-29
Allen, Andre J. (Department: 2855)
Measuring and testing
Speed, velocity, or acceleration
C073S146000, C340S974000
Reexamination Certificate
active
07322236
ABSTRACT:
A manufacturing process of a semiconductor piezoresistive accelerometer includes the steps of: providing a wafer of semiconductor material; providing a membrane in the wafer over a cavity; rigidly coupling an inertial mass to the membrane; and providing, in the wafer, piezoresistive transduction elements, that are sensitive to strains of the membrane and generate corresponding electrical signals. The step of coupling is carried out by forming the inertial mass on top of a surface of the membrane opposite to the cavity. The accelerometer is advantageously used in a device for monitoring the pressure of a tire of a vehicle.
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Baldo Lorenzo
Combi Chantal
Faralli Dino
Villa Flavio Francesco
Allen Andre J.
Iannucci Robert
Jorgenson Lisa K.
Seed IP Law Group PLLC
STMicroelectronics S.r.l.
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