Process for manufacturing a semi-conductor device of the type co

Metal treatment – Process of modifying or maintaining internal physical... – Chemical-heat removing or burning of metal

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29576T, 29576E, 148 15, 148189, 148191, 148DIG3, 148DIG77, 148DIG150, 148DIG117, 156612, 156613, 156614, 156DIG64, 156DIG73, 156DIG95, 357 4, 357 49, H01L 2120, H01L 2176

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045404526

ABSTRACT:
The invention provides a process comprising a step for depositing at least one intrinsic or doped monocrystalline silicon layer on a substrate, also monocrystalline, followed by a step for forming a thin silica layer at the level of the original substrate-silicon interface. The silica layer is obtained by oxidation through the substrate, followed by a heat treatment step during which the monocrystalline silicon is oxidized by the implanted oxygen ions. The first approach may take place according to two variants: thermal or plasma oxidation of the silicon-substrate interface. Oxidation takes place during the return to ambient temperature of the stack of layers after the deposit has been made.

REFERENCES:
patent: 4016006 (1977-04-01), Yoshinaka et al.
patent: 4147584 (1979-04-01), Garrison et al.
patent: 4177084 (1979-12-01), Lau et al.
patent: 4177321 (1979-12-01), Nishizawa
patent: 4275093 (1981-06-01), Sasaki et al.
patent: 4447497 (1984-05-01), Manasevit

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