Process for making thin film silicon-on-insulator wafers employi

Fishing – trapping – and vermin destroying

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

437 62, 437225, 437914, 437966, 437974, 148DIG12, H01L 2176

Patent

active

052139867

ABSTRACT:
A very thin silicon film SOI device can be made utilizing a bond and etch-back process. In the presently claimed invention, boron dopant is introduced into a surface of a silicon device wafer and the doped surface is bonded onto another silicon wafer at an oxide surface. The device wafer is thinned by etching down to the doped region and, by subsequent annealing in hydrogen, boron is diffused out of the silicon surface layer to produce very thin SOI films.

REFERENCES:
patent: 3721588 (1973-03-01), Hays
patent: 3997381 (1976-12-01), Wanlass
patent: 4601779 (1986-07-01), Abernathey et al.
patent: 4649627 (1987-03-01), Abernathey et al.
patent: 4771016 (1988-09-01), Bajor et al.
patent: 4946735 (1990-08-01), Lee et al.
patent: 4983251 (1991-01-01), Haisma et al.
Imai, K., "A New Thinning Method . . . Wafer Bonding", Japanese J. of Appl. Phys., vol. 30, No. 6, Jun. 1991, pp. 1154-1157.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Process for making thin film silicon-on-insulator wafers employi does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Process for making thin film silicon-on-insulator wafers employi, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process for making thin film silicon-on-insulator wafers employi will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-897004

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.