Process for making a multilayer metallization structure

Fishing – trapping – and vermin destroying

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437192, 437228, 437947, H01L 2190

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049435396

ABSTRACT:
A method for forming a via contact for devices having multilayer metallization is provided wherein a sacrificial layer is formed over a bottom interconnect layer, and an interlayer dielectric is formed on the sacrificial layer. A via is etched in the interlayer dielectric, exposing the sacrificial layer. The sacrificial layer is isotropically etched to expose an area of the interconnect metal that is larger than the area of the via and a via metallization is selectively formed on the interconnect metal by chemical vapor deposition so that the via, including a void created by the isotropic etch of the sacrificial layer, is filled with the via metallization, thereby providing a contact area to the bottom interconnect metal which is larger than the via metallization itself.

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Green, M. L., "Applications of CVD W and CVD Al for ULSI Structures", Proceedings of the Electrochemical Society, Spring 1988, pp. 322-323.

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