Optics: measuring and testing – For optical fiber or waveguide inspection
Patent
1998-06-19
2000-09-19
Kim, Robert H.
Optics: measuring and testing
For optical fiber or waveguide inspection
385 24, G01N 2100
Patent
active
061220442
ABSTRACT:
A process for locating a fault on an optical transmission link using a coherent detection reflectometer at a terminal sends over the transmission link measuring pulses and a loading signal interleaved between the measuring pulses. The loading signal is chosen to have the same optical wavelength as the measuring pulses with which it is combined and an extended bandwidth such that the power that it develops in the narrow measuring band of the reflectometer is negligible compared to that developed by the measuring pulses.
REFERENCES:
patent: 5500733 (1996-03-01), Boisrobert et al.
S. Furukawa et al, "Enhanced Coherent OTDR for Long Span Optical Transmission Lines Containing Optical Fiber Amplifiers", IEEE Photonics Technology Letters, vol. 7, No. 5, May 1, 1995, pp. 540-542.
M. Sumida et al, "High-Accurate Fault Location Technology Using FSK-ASK Probe Backscattering Reflectometry in Optical Amplifier Submarine Transmission Systems", Journal of Lightwave Technology, vol. 14, No. 1, Oct. 1996, pp. 2108-2116.
"Fault Detection and Isolation in Optical Transmission Systems Using Optical Amplifiers", IBM Technical Disclosure Builletin, vol. 38, No. 5, May 1, 1995, pp. 59-61.
Gautheron Olivier
Letellier Vincent
Alcatel
Kim Robert H.
Nguyen Tu T.
LandOfFree
Process for locating by reflectometry a fault on an optical tran does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Process for locating by reflectometry a fault on an optical tran, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process for locating by reflectometry a fault on an optical tran will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1078824