Single-crystal – oriented-crystal – and epitaxy growth processes; – Processes joining independent crystals
Patent
1992-05-22
1995-01-03
Breneman, R. Bruce
Single-crystal, oriented-crystal, and epitaxy growth processes;
Processes joining independent crystals
117902, C30B 2914
Patent
active
053776151
ABSTRACT:
The present invention relates to a process for increasing the dimensions of quartz crystals and of quartz-isomorphic materials, which can be produced by hydrothermal growth from seed, in which a seed obtained by assembly of several crystalline plates is used, wherein there are assembled at least two plates of strictly identical lengths and/or widths and of similar thicknesses, cut in at least one crystal and having, on at least three faces crystalline orientations, the deviations from which remain, between the plates, smaller than about 10" of arc, and wherein said plates are brought together on a support by guidance elements, thus ensuring their alignment on the aforementioned three faces while maintaining crystalline orientation deviations smaller than about 10" of arc, one face per plate being left free for growth of the assembled seeds, leading to the production of a single crystal exhibiting at least one dimension greater than that corresponding to the original crystalline plate.
The subject of this invention is also to the crystals obtained by this process.
REFERENCES:
patent: 2931712 (1960-04-01), Thaddeuset et al.
J. Crystal Growth, vol. 71, No. 1, Feb. 1, 1985 pp. 269-272, Amsterdam, NL Aqueous Solution Growth Of KDP From "Spliced" Seeds; Berdui et al.
"Lattice Distortion & Parameter Variation In Quartz and Berlinite Crystals:Methods For Improving the Quality"; Zarka et al., Proceeding 1992 IEEE Freq. Control Sym.
"Recent Results In Study of Piezoelectric Resonators by X-Ray Topography Using Synchrotron Radiation"; Capelle et al; 4th European Freq. & Time Forum Neochapl 13-14 Mar. '1990.
"Mode Shape Analysis Techniques Using Synchrotron X-Ray Topography"; Capelle et al; 44th Annual Symposium or Frequency Control 23-25 May '1990.
"Stroboscopic X-Ray Topography of Quartz Resonators"; Capelle et al; 43rd Annual Frequency Control Symposium 31 May 1 & 2 Jun. '1989.
Arnaud Roger
Cappelle Bernard
Detaint Jacques
Goiffon Aline
Philippot Etienne
Breneman R. Bruce
Centre National de la Recherche Scientifique "CNRS"
France Telecom
Garrett Felisa
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