Process for forming silicon doped group III-V semiconductors wit

Single-crystal – oriented-crystal – and epitaxy growth processes; – Forming from vapor or gaseous state – With decomposition of a precursor

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

117954, 117956, C30B 2940

Patent

active

055803822

ABSTRACT:
An process for efficient controlled N-type silicon doping of Group III-V materials. Through the present invention silicon may be introduced into Group III-V materials at incorporation efficiencies in excess of 10.sup.-4. In a preferred embodiment doping with silicon tetrabromide attains incorporation efficiencies of approximately 0.37. Silicon incorporation efficiencies of approximately 1 should be obtained using silicon tetraiodide. The silicon dopant sources of the present invention may be used to accurately selectively produce net electron concentrations varying from approximately 1.times.10.sup.16 to 1.2.times.10.sup.20 cm.sup.-3. Favorable room temperature vapor pressures of the dopants used in accordance with the present invention allow for production of abrupt doping profiles. Additionally, high photoluminescence peak values, and low contact and sheet resistances are obtained through the present invention. The efficient controlled doping of the present invention is 10,000 times more efficient than known silicon tetrachloride dopant techniques and may be used to produce many semiconductor devices.

REFERENCES:
patent: 2840489 (1958-06-01), Kempter et al.
patent: 4504331 (1985-03-01), Kuech et al.
patent: 4857971 (1989-08-01), Bumhan
patent: 4988640 (1991-01-01), Bohling et al.
patent: 5135607 (1992-08-01), Hirai
patent: 5294285 (1994-03-01), Kanai et al.
patent: 5344792 (1994-09-01), Sandhu et al.
"Si Doped GaAs Using a SiCl.sub.4 Technique in a AsCl.sub.3 /Ga/H.sub.2 CVD System for MESFET", M Fen, V Eu, T Zielinski, and HB Kim, Inst. Phys. Conf. Ser. No. 56; Chapter 1.
"Preparation of amorphous silicon films by chemical vapor deposition from higher silanes Si.sub.n N.sub.2n+2 (n>1)", S. C. Gau, B. R. Weinberger, M. Akhtar, Z. Kiss, and A. G. MacDiarmid, Appl. Phys. Lett. 39(5), Sep. 1, 1981.
"Metalorganic Molecular-Beam Epitaxial Growth and Characterization of GaAs Using Trimethyl--and Triethyl-Gallium Sources", E. Tokumitsu, Y. Kudou, M. Konagai, and K. Takahashi; Japanese Journal of Appl. Phys., vol. 24, No. 9, 1985, 1189-1192.
"Doping of GaAs in Metalorganic MBE using Gaseous Sources"; H. Heinecke, K. Werner, M. Weyers, H. Luth and P. Balk, Journal of Crystal Growth 81 (1987) 270-275.
"Silicon Doping from Disilane in Gas Source MBE of GaAs", K. Kimura, S. Horiguchi, K. Kamon, M. Shimazu, M. Mashita, M. Mihara and M. Ishii; Journal of Crystal Growth 81(1987) 276-280.
"Heavy carbon doping of metalorganic chemical vapor deposition grown GaAs using carbon tetrachloride", B. T. Cunningham, M. A. Haase, M. J. McCollum, J. E. Baker, and G. E. Sullivan, Appl. Phys. Lett. 54(19), May 1989.
"Anomalous Silicon and Tin Doping Behavior in Indium Phosphide Grown by Chemical Beam Epitaxy", P. J. Skevington, D. A. Andrews and G. J. Davies, Journal of Crystal Growth 105 (1990) 371-374.
"All-gaseous doping during chemical-beam epitaxial growth of InGaAs/InGaAsP multiquantum-well lasers", W. T. Tsang, F. S. Choa, R. A. Logban, T. Tanbun-Ek, and A. M. Sergent, Appl. Phys. Lett. 59(9), Aug. 1991.
"Generation of fast-switching As.sub.2 and P.sub.2 beams from AsH.sub.3 for gas-source molecular beam epitaxial growth of InGaAs/InP multiple quantum well and superlattice structures", S. L. Jackson, J. N. Bailargeon, Al. P. Curtis, X. Liu, J. E. Baker, J. I. Malin, K. C. Hsieh, S. G. Bishop, K. Y. Cheng, and G. E. Stillman, J. Vac. Sci. Technol. B 11(3), May/Jun 1993.
Fresina et al, "InP/InGaAs HBTs with Nt-InP Contacting Layers Grown by MOMBE Using SiBr.sub.4 ", Electronic Letters (1994) vol. 30(25) pp. 2177-2178.
Jackson et al, "High-Efficiency Silicon Doping of InP, GaAs in Gas Source . . . ", Applied Physics Letters vol. 64(21) May 23, 1994, pp. 2867-2869.
Weyers et al, "Gaseous Dopant Sources In MOMBE/CBE", Journal of Crystal Growth, vol. 105(1990) pp. 383-392.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Process for forming silicon doped group III-V semiconductors wit does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Process for forming silicon doped group III-V semiconductors wit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process for forming silicon doped group III-V semiconductors wit will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-782048

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.