Semiconductor device manufacturing: process – Having magnetic or ferroelectric component
Reexamination Certificate
2007-09-11
2007-09-11
Baumeister, B. William (Department: 2891)
Semiconductor device manufacturing: process
Having magnetic or ferroelectric component
C257SE21665
Reexamination Certificate
active
11118828
ABSTRACT:
An exemplary method for making a memory structure comprises forming a first ferromagnetic layer, forming a spacer layer above the first ferromagnetic layer, forming a second ferromagnetic layer above the spacer layer by applying a first deposition process to form a thin layer of ferromagnetic material substantially covering the spacer layer, the first layer being formed at a first energy level, and applying a second deposition process to form the remainder of the second ferromagnetic layer above the thin layer of ferromagnetic material, the second ferromagnetic layer being formed at a second energy level, higher than the first energy level. This way, the spacer layer is protected by the thin layer during the second energy level deposition.
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Sharma Manish
Tran Lung
Anya Igwe U.
Baumeister B. William
Myers Bigel & Sibley Sajovec, PA
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