Fishing – trapping – and vermin destroying
Patent
1991-07-11
1995-03-14
Chaudhuri, Olik
Fishing, trapping, and vermin destroying
437 41, 437 48, 437 49, 437228, 437229, 257316, H01L 21265, H01L 21465
Patent
active
053977238
ABSTRACT:
A process for forming an array of FATMOS transistors serving as memory cells of a NAND cell type EEPROM. A multi-layered structure is provided on a substrate with two stacked conductive layers insulated by an intermediate insulative layer, the first or inner conductive layer being insulated by a first insulative layer from the substrate, the second or outer conductive layer being covered with a second insulative layer. The second insulative layer is etched to define a first array of etched layer portions. A photoresist layer is deposited and etched to define a second array of layer portions, each of which is positioned between two neighboring ones of the first array of layer portions. The multi-layered structure is etched with the first and second layer portions being as a mask, to thereby form an array of a plurality of pairs of insulated gate electrodes above the substrate. A chosen impurity is doped into the substrate with the insulated gate electrodes serving as a mask to thereby form impurity-doped regions in the substrate.
REFERENCES:
patent: 4233526 (1980-11-01), Kurug et al.
patent: 4574468 (1986-03-01), Slotboom et al.
patent: 4619039 (1986-10-01), Maas et al.
patent: 4659428 (1987-04-01), Maas et al.
patent: 4694314 (1987-09-01), Terala et al.
patent: 4849369 (1989-07-01), Jeuch et al.
patent: 4939690 (1990-07-01), Momodomi et al.
patent: 5008856 (1991-04-01), Iwahashi
patent: 5013674 (1991-05-01), Bergemont
patent: 5026665 (1991-06-01), Zdebel
patent: 5057462 (1991-10-01), Eisenberg et al.
patent: 5106778 (1992-04-01), Hollis et al.
patent: 5149666 (1992-09-01), Mikata et al.
patent: 5290723 (1994-03-01), Tani et al.
IEEE Journal of Solid-State Circuits, vol. SC-17, No. 5, Oct. 1982, pp. 821-827, C. Kuo, et al., "An 80 ns 32K EEPROM Using the FETMOS Cell".
Aritome Seiichi
Endoh Tetsuro
Kirisawa Ryouhei
Momodomi Masaki
Nakayama Ryozo
Booth Richard A.
Chaudhuri Olik
Kabushiki Kaisha Toshiba
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