Process for forming a semiconductor device having a metal-semico

Fishing – trapping – and vermin destroying

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437 41, 437200, 437241, H01L 21283

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055455743

ABSTRACT:
A metal-semiconductor compound (72, 74, 76) is formed after a step that introduces nitrogen into regions (52, 54, 56) of the device (100). In one embodiment, a nitrogen-containing gas is exposed to surfaces (42, 44, 46) before forming a titanium layer (62) is deposited. A one-step anneal is performed to form titanium disilicide regions (72, 72, 76) that are in the C54 phase without thermal agglomeration or forming electrical shorts between the titanium disilicide regions (72, 74, 76).

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