Process for forming a doped oxide film and doped semiconductor

Stock material or miscellaneous articles – Composite – Of silicon containing

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148188, 427 85, 428447, 428696, 428704, H01L 2318, B32B 904

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045713669

ABSTRACT:
A process for forming a doped oxide film and a doped semiconductor suitable for electronic applications wherein a silicon tetraalkoxide is reacted with a limited amount of water to produce a low molecular weight, soluble polyorganosiloxane. The polyorganosiloxane is subsequently admixed with a soluble dopant element compound to form a homogeneous, polyorganosiloxane-dopant compound solution. The solution is coated onto a semiconductor wafer substrate material and heated to produce an impurity doped semiconductor wafer suitable for electronic application.

REFERENCES:
patent: 3084079 (1963-04-01), Harrington
patent: 3514348 (1970-05-01), Yu
patent: 3615943 (1971-10-01), Genser
patent: 3658584 (1972-04-01), Schmidt
patent: 3660156 (1972-05-01), Schmidt
patent: 3789023 (1974-01-01), Ritchie
patent: 3798081 (1974-03-01), Beyer
patent: 3834939 (1974-09-01), Beyer
patent: 3837873 (1974-09-01), Pollack et al.
patent: 3915766 (1975-10-01), Pollack et al.
patent: 3928225 (1975-12-01), Schafer
patent: 4152286 (1979-05-01), Crossen et al.
patent: 4236948 (1980-12-01), Seibold et al.
patent: 4243427 (1981-01-01), DiBugnara
patent: 4251285 (1981-02-01), Yoldas et al.

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