Process for fabricating field effect transistors

Metal working – Method of mechanical manufacture – Assembling or joining

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

29576B, 29578, 29591, 148DIG82, 357 22, 357 233, H01L 21265, H01L 2980

Patent

active

045596930

ABSTRACT:
A process for fabricating a field effect transistors having a source electrode, a drain electrode and a gate electrode, including the steps of forming first to third conjoined narrow portions of thin film on an active region of a semiconductor, the second thin film portion having a different etching rate from the first and third and implanting ions into the active region to form a high carrier concentration region by using the conjoined films as a mask. The thickness of the second film portion determines the gate electrode length and the thickness of the third film portion determines the distance between the high carrier concentration region at the source side and the gate electrode.

REFERENCES:
patent: 4359816 (1982-11-01), Abbas et al.
patent: 4426767 (1984-01-01), Swanson et al.
Proc. of 44th Autumn Meeting of the Jap. Soc. of Appl. Phys., and of the Related Soc. p. 543 26p-E-13, Reporters: Terada et al., 1983.
Proc. of 44th Autumn Meeting of the Jap. Soc. of Appl. Phys. and of the Related Soc. p. 509 25a-J-10, Reporters: Katano et al., 1983.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Process for fabricating field effect transistors does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Process for fabricating field effect transistors, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process for fabricating field effect transistors will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1471810

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.