Process for fabricating amorphous hydrogenated silicon...

Etching a substrate: processes – Etching to produce porous or perforated article

Reexamination Certificate

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C216S057000, C216S080000, C216S097000

Reexamination Certificate

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07850863

ABSTRACT:
A process for fabricating a hydrogenated amorphous silicon carbide film having through-pores includes the formation on a substrate of a film consisting of an amorphous hydrogenated silicon carbide matrix in which silicon oxide nanowires are dispersed therethrough, and then the selective destruction by a chemical agent of the silicon oxide nanowires present in the film formed at step a). Applications include microelectronics and micro-technology, in all fabrication processes that involve the degradation of a sacrificial material by diffusion of a chemical agent through a film permeable to this agent for the production of air gaps, in particular the fabrication of air-gap interconnects for integrated circuits.

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French Patent Office Search Report, dated Aug. 29, 2008.
M. J. Loboda, “New solutions for internal dielectrics using trimethylsilane-based PECVD process,” Elsevier Microelectronic Engineering, vol. 50, pp. 15-23, 2000, XP-002493946.
Sonnenburg et al., “Synthesis and characterization of SiC materials with hierarchical porosity obtained by replication techniques,” Physical Chemistry Chemical Physics, vol. 8, pp. 3561-3566, 2006, XP-002493853.

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