Process for determining the thickness of a layer of...

Electricity: measuring and testing – Magnetic – With means to create magnetic field to test material

Reexamination Certificate

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C324S202000

Reexamination Certificate

active

06198278

ABSTRACT:

PRIOR ART
The invention is based on a process for determining a thickness of a layer of electrically conductive material, particularly a chromium layer. In practical operation up to this point, chromium-plated parts have been measured using the X-ray fluorescence process, for example. This process, however, is expensive and time-consuming. Also, the so-called inductive measurement method is used. However with this kind of measurement, only point-like measurements on the surface are possible, which require a very high positioning precision for use in practical operation. In both processes, though, it is relatively difficult to eliminate the occurrence of measurement errors.
ADVANTAGES OF THE INVENTION
The process according to the invention, for determining the thickness of a layer of electrically conductive material, has the advantage over the prior art that the occurrence of measurement errors can be largely eliminated.
In particular, coated parts that are mass produced can be checked in a continuously operating measurement process. Possible fluctuations in the material quality of the base material and variations in the distance between the measurement coil and the measurement object to be defined that are caused, for example, by means of soiling or wear, can be eliminated. As a result, a very reliable and clear statement can be made as to the thickness of the layer to be defined.
Advantageous improvements and updates of the process disclosed are possible by means of the measures taken hereinafter.


REFERENCES:
patent: 5343146 (1994-08-01), Koch et al.
patent: 1237 335 (1967-03-01), None
patent: 2061708 (1971-07-01), None
patent: 3404720 (1985-08-01), None
patent: 42 27 735 (1994-02-01), None
patent: 2145827 (1985-03-01), None

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