Process for determining the resistivity of a resistive layer

Details Process for determining the resistivity of a resistive layer Process for determining the resistivity of a resistive layer

2006-01-10

2006-01-10

LeDynh, Bot (Department: 2862)

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

C324S644000

Reexamination Certificate

active

06984976

ABSTRACT:
The invention is a process for determining the resistivity of a layered structure including a layer of resistive material hidden under a topcoat and a tile layer, the process comprises the steps of; 1) directing electromagnetic radiation over a selected frequency range to the outer surface of the layered structure; 2) measuring the reflection of the electromagnetic radiation from the layered structure surface; 3) converting the signal into the time domain; 4) analyzing the first echo to obtain the topcoat thickness; 5) obtaining the tile thickness from the time delay between the first and second echoes; 6) compensating the second echo with electromagnetic power loss due to the topcoat and tile; and 7) determining the resistance of the resistive layer from the compensated second echo.

REFERENCES:
patent: 5012248 (1991-04-01), Munro et al.
patent: 5355083 (1994-10-01), George et al.
patent: 6788244 (2004-09-01), Tam

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