Thermal measuring and testing – Temperature measurement – Temperature distribution or profile
Patent
1989-04-06
1990-05-08
Shoap, Allan N.
Thermal measuring and testing
Temperature measurement
Temperature distribution or profile
374142, 374159, 374210, 374141, G01K 1100
Patent
active
049233084
ABSTRACT:
A process for determining a relative temperature distribution at a surface of a high temperature member to be used in a gas containing oxygen at high temperatures is disclosed. The process comprises the step of determining the relative surface temperature distribution of the member by measuring concentrations of oxygen at the surface of the member, which surface is composed of silicon carbide or silicon nitride. The process may also include the step of quantitatively determining a distribution of temperatures at the surface of the member by measuring concentrations of oxygen at the surface of the member, determining a relationship between temperatures and concentrations of oxygen on a surface of a standard member, and comparing the measured oxygen concentrations at the surface of the member with those of a standard member with reference to this relationship.
REFERENCES:
patent: 3652427 (1972-03-01), Flood et al.
patent: 3891512 (1975-06-01), Jackson
patent: 3935079 (1976-01-01), Fitterer et al.
patent: 4133036 (1979-01-01), Watson
patent: 4223549 (1980-09-01), Kitzinger
Russell, C. K. et al., "Probing For More Than Temperature", Journal of Metals, vol. 23, No. 11, pp. 44-47 (Nov. 1971).
Matsuhisa Tadaaki
Sakai Hiroaki
Watanabe Keiichiro
Gutierrez Diego F. F.
NGK Insulators Ltd.
Shoap Allan N.
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