Coating processes – Measuring – testing – or indicating
Patent
1992-03-17
1995-03-07
Beck, Shrive
Coating processes
Measuring, testing, or indicating
427 10, 427228, 427245, 427294, B05D 100
Patent
active
053956419
ABSTRACT:
A process for detecting any defect in a ceramic body, including the steps of forming an electrically conductive layer in any such defects including fine voids present in the ceramic body, and then detecting presence or absence of the defect by measuring electrical conductivity between two given points shorted by the electrically conductive layer. The electrically conductive layer may be formed by penetrating an electrically conductive liquid into the defect. Alternatively, the electrically conductive layer may be formed by penetrating a penetrable liquid capable of forming the electrically conductive layer by thermal treatment or chemical treatment and thermally or chemically treating same.
REFERENCES:
patent: 4034286 (1977-07-01), Lev et al.
patent: 4443278 (1984-04-01), Zingher
patent: 4578279 (1986-03-01), Zingher
patent: 4894251 (1990-01-01), Sieverin
De-Zeitschrift: Mitt. des Vereins Dt. Emailfachleute e.V. Patent Abstracts of Japan, vol. 14, No. 349, P-1084, Jul. 27, 1990; JP-2-126147.
Shibata Kazuyoshi
Suzuki Toshihiko
Beck Shrive
Dang Vi Duong
NGK Insulators Ltd.
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