Coating processes – Measuring – testing – or indicating
Patent
1978-04-28
1979-04-10
Smith, John D.
Coating processes
Measuring, testing, or indicating
23230A, 23232C, 23232E, 423350, 427 10, 427 86, 427248R, 427 95, C23C 1106, C01B 3302
Patent
active
041489314
ABSTRACT:
A semiconductor material, such as elemental silicon, is deposited on heated rod-shaped mandrels from a reactive gas stream capable of pyrolytically depositing silicon wherein the gas stream is regulated in such a manner that the silicon deposition rate remains constant per cubic centimeter of mandrel surface throughout the deposition process.
REFERENCES:
patent: 3120451 (1964-02-01), Schmidt et al.
patent: 3900660 (1975-08-01), Bradley
patent: 3933985 (1976-01-01), Rodgers
patent: 4068020 (1978-01-01), Reuschel
Dietze Wolfgang
Reuschel Konrad
Rucha Ulrich
Siemens Aktiengesellschaft
Smith John D.
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