Process for controlling metal thickness, and deposition and degr

Details Process for controlling metal thickness, and deposition and degr Process for controlling metal thickness, and deposition and degr

1975-03-03

1978-02-14

Kendall, Ralph S.

Coating processes

Measuring, testing, or indicating

Thickness or uniformity of thickness determined

250272, 250273, 250358R, 204 1T, 204181N, 156626, 118 9, 427304, 427436, G01N 23203

Patent

active

040739643

ABSTRACT:
Metal layer thicknesses on articles during formation or degradation, as in electroless or electrolytic deposition or chemical etching, are measured and controlled by a process comprising determining the radiation scattering capacity of a corresponding metallic layer deposited on or removed from a test sample while the test sample is present in a bath solution during formation or degradation of the metal layer. Also provided is a novel immersible sensor for measuring the rate and thickness of metal layers being deposited or degraded.

REFERENCES:
patent: 3019336 (1962-01-01), Johns
patent: 3147169 (1964-09-01), Albertson
patent: 3475242 (1969-10-01), Radimer
patent: 3503817 (1970-03-01), Radimer
patent: 3719565 (1973-03-01), Herrmann
IBM Technical Disclosure Bulletin, vol. 17, No. 6, Nov. 1974, pp. 427-510.

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