Chemistry: analytical and immunological testing – Nuclear magnetic resonance – electron spin resonance or other...
Reexamination Certificate
2008-01-15
2008-01-15
Gakh, Yelena G. (Department: 1743)
Chemistry: analytical and immunological testing
Nuclear magnetic resonance, electron spin resonance or other...
C436S085000, C436S164000
Reexamination Certificate
active
07319040
ABSTRACT:
A method for providing improved estimates of properties of a chemical manufacturing process is disclosed. The method employs a process model that includes, or is modified by, scores or other gains obtained from the mathematical transformation of data obtained from an on-line analyzer. Chemical manufacturing processes using the method also are disclosed.
REFERENCES:
patent: 4349869 (1982-09-01), Prett et al.
patent: 4616308 (1986-10-01), Morshedi et al.
patent: 4888704 (1989-12-01), Topliss et al.
patent: 5504166 (1996-04-01), Buchelli et al.
patent: 5650722 (1997-07-01), Smith et al.
patent: 5675253 (1997-10-01), Smith et al.
patent: 5877954 (1999-03-01), Klimasauskas et al.
patent: 5933345 (1999-08-01), Martin et al.
patent: 6072576 (2000-06-01), McDonald et al.
patent: 6144897 (2000-11-01), Selliers
patent: 6204664 (2001-03-01), Sardashti et al.
patent: 2002/0103548 (2002-08-01), Treiber et al.
patent: 0151588 (2001-07-01), None
patent: 0146762 (2001-08-01), None
Thompson et al. “Modeling chemical processes using prior knowledge and neural networks” AlChE Journal. New York: Aug. 1994. vol. 40; p. 1328.
Thor Mejdell and Sigurd Skogestad, “Estimation of Distillation Compositions from Multiple Temperature Measurements using PLS Regression,” Paper 148d., AlChE Annual Meeting (1991).
Robert R. Megien, “Examining Large Databases: A Chemometric Approach Using Principal Component Analysis,” Journal of Chemometrics, vol. 5, (1991): 163-179.
Robert R. Megien; “Chemometrics: Its Role in Chemistry and Measurement Sciences,” Chemometrics and Intelligent Laboratory Systems, vol. 3 (1988): 17-29.
Hurlbut Ronald S.
Stephens William D.
Vaidyanathan Ramaswamy
Van Hare David R.
Gakh Yelena G.
Ineos USA LLC
Yusko David P.
LandOfFree
Process control using on-line instrumentation and process... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Process control using on-line instrumentation and process..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process control using on-line instrumentation and process... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2788684