Metal treatment – Process of modifying or maintaining internal physical... – With measuring – testing – or sensing
Patent
1991-10-31
1994-02-15
Wyszomierski, George
Metal treatment
Process of modifying or maintaining internal physical...
With measuring, testing, or sensing
148511, 73597, 73602, 73657, G01H 500
Patent
active
052863131
ABSTRACT:
A system for non-destructively measuring an object and controlling industrial processes in response to the measurement is disclosed in which an impulse laser generates a plurality of sound waves over timed increments in an object. A polarizing interferometer is used to measure surface movement of the object caused by the sound waves and sensed by phase shifts in the signal beam. A photon multiplier senses the phase shift and develops an electrical signal. A signal conditioning arrangement modifies the electrical signals to generate an average signal correlated to the sound waves which in turn is correlated to a physical or metallurgical property of the object, such as temperature, which property may then be used to control the process. External, random vibrations of the workpiece are utilized to develop discernible signals which can be sensed in the interferometer by only one photon multiplier. In addition the interferometer includes an arrangement for optimizing its sensitivity so that movement attributed to various waves can be detected in opaque objects. The interferometer also includes a mechanism for sensing objects with rough surfaces which produce speckle light patterns. Finally the interferometer per se, with the addition of a second photon multiplier is capable of accurately recording beam length distance differences with only one reading.
REFERENCES:
patent: 3694088 (1972-09-01), Gallagher et al.
patent: 4144767 (1979-03-01), Kaule et al.
patent: 4201473 (1980-05-01), Domenicali et al.
patent: 4225240 (1980-09-01), Balasubramanian
patent: 4468551 (1984-08-01), Neiheisel
patent: 4539846 (1985-09-01), Grossman
patent: 4541280 (1985-09-01), Cielo et al.
patent: 4622202 (1986-11-01), Yamada et al.
patent: 4633715 (1987-01-01), Monchalin
patent: 4659224 (1987-04-01), Monchalin
patent: 4966459 (1990-10-01), Monchalin
patent: 5052661 (1991-10-01), Dunlay et al.
patent: 5080491 (1992-01-01), Monchalin
patent: 5137361 (1992-08-01), Heon et al.
Report published by the National Technical Information Service, "Development and Evaluation of Workpiece Temperature Analyzer for Industrial Furnaces".
Page 61 of the Apr. 1991 issue of NASA Tech Briefs.
McGraw-Hill Encyclopedia of Science & Technology, 1987 edition, vol. 9, pp. 289-297.
Brochure from Zygo Corp. "Mark IVXP Interferometer System", 1990.
Kotidis Petros A.
Rostler Peter S.
Schultz Thomas J.
Woodroffe Jaime A.
Nawalanic Frank J.
Surface Combustion, Inc.
Wyszomierski George
LandOfFree
Process control system using polarizing interferometer does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Process control system using polarizing interferometer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process control system using polarizing interferometer will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1203870