Measuring and testing – Instrument casing
Reexamination Certificate
2006-05-01
2009-06-02
Raevis, Robert R (Department: 2856)
Measuring and testing
Instrument casing
C324S156000
Reexamination Certificate
active
07540188
ABSTRACT:
A process condition measuring device has electronic components sandwiched between two conductive substrate portions. The conductive substrate portions are joined by an electrically conductive pathway. Native oxide is removed from substrate portions and electrically conductive contact pads are formed that are then joined together with electrically conductive adhesive to form the electrically conductive pathway.
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Jensen Earl M.
Wiese Lynn Karl
Isenberg Joshua D.
JDI Patent
Raevis Robert R
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