Process and machine for partially plating test probes

Electrolysis: processes – compositions used therein – and methods – Electrolytic coating – Coating selected area

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Details

205148, 204222, 204273, C25D 502

Patent

active

060368373

ABSTRACT:
A method and two-part plating apparatus for plating groups of elongated objects. The plating apparatus includes a fixture and a fixture support. The fixture is configured to loosely retain a group of elongated articles in a generally vertical orientation where the upper ends are contained within a cavity and the lower ends are in contact with a support surface. The cavity includes an electrode which is electrically connected to the upper ends of the elongated articles. The fixture is configured to be placed onto and partially through a fixture support which is in contact with a container of plating solution. The fixture support has a base and an agitation element which moves the fixture with respect to the base, thus shifting and exposing surfaces of the elongated articles to facilitate plating.

REFERENCES:
patent: 1079427 (1913-11-01), Murphy
patent: 1335177 (1920-03-01), Merritt
patent: 2721834 (1955-10-01), Koury
patent: 3275542 (1966-09-01), Couture
patent: 3276986 (1966-10-01), Swistun
patent: 3397126 (1968-08-01), Gilbert
patent: 3616281 (1971-10-01), Head et al.
patent: 3804732 (1974-04-01), Goodkin
patent: 4312716 (1982-01-01), Maschler et al.
patent: 4359366 (1982-11-01), Eidschun
patent: 4364801 (1982-12-01), Salama
patent: 4399019 (1983-08-01), Kruper et al.
patent: 4497693 (1985-02-01), Ogura et al.
patent: 5200048 (1993-04-01), Tanaka et al.
patent: 5217536 (1993-06-01), Matsumura et al.
patent: 5726361 (1998-03-01), Ogawa

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