Process and device for the generation of a linearly dependent me

Details Process and device for the generation of a linearly dependent me Process and device for the generation of a linearly dependent me

1987-03-09

1989-03-28

McGraw, Vincent P.

Optics: measuring and testing

By dispersed light spectroscopy

With background radiation comparison

356315, 356312, 356319, G01J 336, G01N 2172

Patent

active

048158470

ABSTRACT:
A process which extends the measurement range of Zeeman atomic absorption spectroscopy by linearization of the calibration curve in the region of relatively high sample concentration. The intensities of the Zeeman components I.pi.o, I.sigma.o, I.pi. and I.sigma. are measured before entry into the measurement cell and after absorption by the measurement sample and are associated according to the formula ##EQU1##

REFERENCES:
patent: 3586441 (1971-06-01), Smith et al.
patent: 3689158 (1972-09-01), Shifrin
patent: 3937577 (1976-02-01), Dorsch
patent: 4035083 (1977-07-01), Woodriff et al.
"Nachrichten aus Chemie, Technik und Laboratorium" (Reports from the Chemical, Engineering and Laboratory Sectors), Zeeman-Atom-Absorptions-Spektroskopie, vol. 29, No. 12/81 (1981).

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