X-ray or gamma ray systems or devices – Specific application – Fluorescence
Reexamination Certificate
2006-09-28
2010-02-16
Kiknadze, Irakli (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Fluorescence
C378S070000
Reexamination Certificate
active
07664225
ABSTRACT:
Process and device for fast or on-line determination of the components of a two-component or multiple-component system in which the elements which constitute the individual components differ by their atomic number. The following steps are carried out: the surface of the substance is irradiated with polychromatic X-ray or monochromatic gamma radiation, the X-ray radiation exhibiting in the energy range from 1 to 30 keV one or more peaks in the continuum. The spectrum of the radiation backscattered and emitted by the substance is measured in an energy range from 1 to 30 keV with a resolution of at least 250 eV. The spectrum is analysed in that at least the intensities of the elastically backscattered and inelastically backscattered peaks are separately determined and at least some Kaor Lafluorescence peaks in the energy range from 1 to 30 keV are used in order to compensate for the influence of a fluctuating elemental composition within a component.
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“Analysis of Metal Alloys by Rayleigh to Compton Ratios and X-ray Fluorescence Peaks In The 50 to 122 keV Energy Range,” 1) G. E. Gigante; Dipartimento di Scienze Biomediche, Universita dell Aquila, 67100 L'Aquila, Italy 2) L. J. Pedraza; International Centre for Theoretical Physics, P.O. Box 586, 34100 Trieste, Italy and 3) S. Sciuti; Dipartimento di Energetico, Universita di Roma “La Sapienza,” 00100 Roma, Italy; received Feb. 20, 1985 and in revised form Apr. 11, 1985; Nuclear Instruments and Methods in Physics Research B12 (1985) 229-234, North-Holland, Amsterdam.
Katz Elisabeth
Kiknadze Irakli
Rabin & Berdo PC
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