Process and device for system characterization by spectral analy

Details Process and device for system characterization by spectral analy Process and device for system characterization by spectral analy

1982-06-29

1985-07-02

Tokar, Michael J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Analysis of complex waves

324 77C, G01R 2316

Patent

active

045271160

ABSTRACT:
A pseudo-random measuring signal whose spectrum is constituted by lines of predetermined frequencies spaced apart from each other is applied to a system to be characterized, and one or, successively and one by one, a plurality of lines of the spectrum of the measuring signal are selected for making a comparison in phase and amplitude between the input and the output of the system; for a non-linear system, one or, successively and one by one, a plurality of lines of the spectrum of the measuring signal are eliminated at the input of the system, and the phase and/or amplitude of the corresponding line is measured at the output of the system.

REFERENCES:
patent: 3935437 (1976-01-01), Schmitt et al.
patent: 4067060 (1978-01-01), Poussart et al.
patent: 4306186 (1981-12-01), Nakazawa et al.
patent: 4321680 (1982-03-01), Bertrand et al.
patent: 4325023 (1982-04-01), Zigwick

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