Process and device for monitoring a machine

Details Process and device for monitoring a machine Process and device for monitoring a machine

2011-01-04

2011-01-04

Tsai, Carol S (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system

Performance or efficiency evaluation

C702S179000, C702S180000, C700S108000, C700S109000, C700S110000, C706S912000, C714S033000, C714S703000

Reexamination Certificate

active

07865333

ABSTRACT:
A process for monitoring a machine, within the framework of a FMEA process for at least one component of the machine for at least one predetermined fault which can be diagnosed by means of a diagnosis diagram and a diagnosis system with sensors for detecting physical parameters of the machine, a diagnosis priority number being determined which is the product of the following index quantities: severity of the effect of occurrence of the fault with respect to the serviceability of the machine; expected machine-specific consequential costs when a fault occurs, and the possibility of correction of the fault. The diagnosis priority number is used in the evaluation of the diagnosis diagram, the diagnosis system, the current machine state, the necessary maintenance measures and/or the failure risk of the machine.

REFERENCES:
patent: 4985857 (1991-01-01), Bajpai et al.
patent: 5210704 (1993-05-01), Husseiny
patent: 5457375 (1995-10-01), Marcinkiewicz et al.
patent: 5648919 (1997-07-01), Yamauchi et al.
patent: 6643592 (2003-11-01), Loman et al.
patent: 6711523 (2004-03-01), Bechhoefer et al.
patent: 6859756 (2005-02-01), Allen
patent: 6968293 (2005-11-01), Wiegand
patent: 7006948 (2006-02-01), Allen
patent: 7027953 (2006-04-01), Klein
patent: 7249284 (2007-07-01), Shah et al.
patent: 7337092 (2008-02-01), Yuan et al.
patent: 7379846 (2008-05-01), Williams et al.
patent: 7516047 (2009-04-01), Allen
patent: 7571022 (2009-08-01), Jalluri et al.
patent: 7587299 (2009-09-01), Miyasaka et al.
patent: 2004/0143398 (2004-07-01), Nelson
patent: 2004/0263342 (2004-12-01), Matlock et al.
patent: 2005/0154561 (2005-07-01), Legault et al.
patent: 2007/0050178 (2007-03-01), Linzey et al.
patent: 2007/0112746 (2007-05-01), Todhunter
patent: 101 39 968 (2002-07-01), None
patent: 10 2005 031 436 (2007-01-01), None
patent: 1 760 311 (2007-03-01), None
Seung J. Rhee and Kosuke Ishii; Using Cost Based FMEA to Enhance Reliability and Serviceability; Advanced Engineering Informatics 17 (2003) 179-188; Department of Mechanical Engineering, Design Division, Stanford University, Stanford, CA 94305, USA; Available Online at www.sciencedirect.com.

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