Process and device for inspecting a surface in simulated manner

Electricity: measuring and testing – Magnetic – With compensation for test variable

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324234, 324262, G01N 2772, G01R 3312

Patent

active

045556644

ABSTRACT:
The invention relates to a process and to devices for the inspection of the surface of a member by means of an eddy current probe. By scanning the member means of the transducer following a given path, the sampled values of the signal supplied by the transducer are recorded for clearly defined positions of the transducer. By restoring the signals, it is possible to simulate a displacement of the transducer along a different path and/or simulate the displacement of a larger size or different type of transducer. The process may be used in steam generators in nuclear reactors and to the examination of irradiated fuel rods in these reactors.

REFERENCES:
patent: 3419797 (1968-12-01), Libby
patent: 4194149 (1980-03-01), Holt et al.
patent: 4225929 (1980-09-01), Ikeda
patent: 4241412 (1980-12-01), Swain

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Process and device for inspecting a surface in simulated manner does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Process and device for inspecting a surface in simulated manner , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process and device for inspecting a surface in simulated manner will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-271406

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.