Process and device for evaluating symbol lengths on a...

Details Process and device for evaluating symbol lengths on a... Process and device for evaluating symbol lengths on a...

2005-10-11

2005-10-11

Miller, Brian E. (Department: 2652)

Dynamic information storage or retrieval

Condition indicating, monitoring, or testing

Including radiation storage or retrieval

Reexamination Certificate

active

06954413

ABSTRACT:
A symbol length is evaluated on the basis of receiving a first-symbol length, and a phase error with respect to detection of a length of the first symbol before receiving a length of a second symbol following the first symbol. The process includes evaluating at least two random phase errors on the basis of the phase error received. A first random phase error is dependent on a deterministic phase error with respect to a first state corresponding to an absence of a corrected first-symbol length. A second random phase error is dependent on a deterministic phase error with respect to a second state corresponding to the corrected first-symbol length. The process includes retaining as an evaluated symbol length the first-symbol length received if the absolute value of the first random phase error reduces a condition of passing through the first state. The second step also retains as an evaluated symbol length the corrected first-symbol length if the absolute value of the second random phase error reduces the condition of passing through the second state.

REFERENCES:
patent: 5337335 (1994-08-01), Cloetens et al.
patent: 5978335 (1999-11-01), Clark et al.
patent: 6134197 (2000-10-01), Ishibashi et al.
patent: 6392569 (2002-05-01), Mimachi et al.
patent: 6654325 (2003-11-01), Minemura et al.
patent: 0544358 (1993-06-01), None
patent: 1022858 (2000-07-01), None

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