Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1997-03-06
1998-08-25
Do, Diep N.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324677, 324701, 324704, 324711, G01R 2702, G01N 2702
Patent
active
057986509
ABSTRACT:
A process for controlling the weldability of a sheet (1) of the composite metal sheet type having a layer (7) which is interposed between two metal facing sheets (3,5) and comprises a polymer (8) having a filler of conductive particles (9). This process comprises measuring by means of a signal of given frequency f applied to two electrodes (11,13) disposed in facing relation to each other, each electrode being in contact with a corresponding metal facing sheet (3,5), the voltage/current phaseshift .phi. due to the resistive and capacitive properties of the composite sheet (1). The response of the composite sheet (1) to this signal corresponds to that of an equivalent parallel RC circuit. Thereafter, the mass fraction of the conductive particles (9) is calculated from the value of .phi.. By comparing the determined mass fraction with prefixed thresholds, the weldability and the vibration-damping capacity of the composite sheet (1) are evaluated.
REFERENCES:
patent: 2528342 (1950-10-01), Cuckler
patent: 3355664 (1967-11-01), Panke
patent: 3535631 (1970-10-01), Geest et al.
patent: 4968947 (1990-11-01), Thorn
patent: 5212982 (1993-05-01), Macchiarulo et al.
patent: 5508622 (1996-04-01), Gatzlaff
Do Diep N.
Sollac
LandOfFree
Process and device for determining the mass fraction of one cons does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Process and device for determining the mass fraction of one cons, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process and device for determining the mass fraction of one cons will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-38365