Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate
2006-09-05
2006-09-05
Rosenberger, Richard A. (Department: 2877)
Optics: measuring and testing
Inspection of flaws or impurities
Surface condition
Reexamination Certificate
active
07102744
ABSTRACT:
A light beam is directed towards a surface along a direction normal to the surface. The surface is caused to move so that the beam scans the surface along a spiral path. An ellipsoidal mirror is placed with its axis along the surface normal to collect light scattered by the surface and any anomalies at the surface at collection angles away from the surface normal. In some applications, a lens arrangement with its axis along the surface normal is also used to collect the light scattered by the surface and any anomalies. The light scattered by the mirror and lenses may be directed to the same or different detectors. Preferably light scattered by the surface within a first range of collection angles from the axis is detected by a first detector and light scattered by the surface within a second range of collection angles from the axis is detected by a second detector. The two ranges of collection angles are different, with one detector optimized to detect scattering from large particles and defects and the other detector optimized to detect light from small particles and defects.
REFERENCES:
patent: 4314763 (1982-02-01), Steigmeier et al.
patent: 4360275 (1982-11-01), Louderback
patent: 4378159 (1983-03-01), Galbraith
patent: 4391524 (1983-07-01), Steigmeier et al.
patent: 4423331 (1983-12-01), Koizumi et al.
patent: 4479714 (1984-10-01), Lehrer
patent: 4508450 (1985-04-01), Ohshima et al.
patent: 4523841 (1985-06-01), Brunsting et al.
patent: 4526468 (1985-07-01), Steigmeier et al.
patent: 4598997 (1986-07-01), Steigmeier et al.
patent: 4735504 (1988-04-01), Tycko
patent: 4744663 (1988-05-01), Hamashima et al.
patent: 4794265 (1988-12-01), Quackenbos et al.
patent: 4893932 (1990-01-01), Knollenberg
patent: 5076692 (1991-12-01), Neukermans et al.
patent: 5108176 (1992-04-01), Malin et al.
patent: 5125741 (1992-06-01), Okada et al.
patent: 5189481 (1993-02-01), Jann et al.
patent: 5270794 (1993-12-01), Tsuji et al.
patent: 5315609 (1994-05-01), Tanaka et al.
patent: 5377001 (1994-12-01), Malin et al.
patent: 5377002 (1994-12-01), Malin et al.
patent: 5389794 (1995-02-01), Allen et al.
patent: 5406367 (1995-04-01), Sopori
patent: 5585916 (1996-12-01), Miura et al.
patent: 5606153 (1997-02-01), Fix, Sr. et al.
patent: 6178257 (2001-01-01), Alumot et al.
patent: 614830 (1988-01-01), None
patent: 61-289288 (1988-06-01), None
patent: 63-140904 (1988-06-01), None
patent: 62-85449 (1988-11-01), None
“Requirements for Future Surface Inspection Equipment for Bare Silicon Surfaces,” P. Wagner and M Brohl, Wacker-Chemitronic GmbH, Burghausen, Germany, W. Baylies, BayTech Group, Weston Massachusetts.
“The Importance of Media Refractive Index in Evaluating Liquid and Surface Microcontamination Measurements,” R. Knollenberg et al., The Journal of Environmental Sciences, Mar./Apr. 1987.
International Search Report Issued by the International Patent Office (WIPO) corresponding to the International Patent Application No.: PCT/US96/15354 issued on Dec. 27, 1996.
Notification of Transmittal of International Preliminary Examination Report, dated Nov. 19, 1997, issued in corresponding PCT Appln. No. PCT/US96/15354, 12 pages.
Written Opinion issued Jul. 15, 1997 in corresponding PCT Appln. No. PCT. Appln, No. PCT/US96/153454, 3 pages.
Altendorfer Hubert
Gross Kenneth P.
Kren George
Marxer Norbert
KLA-Tencor Corporation
Parsons Hsue & de Runtz LLP
Rosenberger Richard A.
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