Process and arrangement for the alignment of imaging systems

Details Process and arrangement for the alignment of imaging systems Process and arrangement for the alignment of imaging systems

1979-02-02

1980-12-09

Corbin, John K.

Optics: measuring and testing

Range or remote distance finding

Triangulation ranging to a point with two or more projected...

250237R, 354200, 355 55, 356381, G01C 300, G01B 1106, G03B 1318

Patent

active

042381576

ABSTRACT:
A process and apparatus for the alignment of the image plane of an imaging system with the interception plane of the image utilizing a measuring mark reproduced by at least two partial pupils of the imaging system. The two imaging beams associated with the partial pupils are distinguishable from one another and at least one partial pupil is moved over the full pupil of the imaging system. A minimum movement of the image of the measuring mark corresponds to alignment of the image and interception planes.

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Electronics (International Edition), Aug. 19, 1976, pp. 4E and 6E, "Junction Field Effect Transistor . . . ".

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