Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate
2006-05-26
2009-12-01
Sarkar, Asok K (Department: 2891)
Semiconductor device manufacturing: process
Chemical etching
Combined with the removal of material by nonchemical means
C257SE21214, C257SE21230, C257SE21237, C257SE21304, C438S691000, C438S692000, C438S959000
Reexamination Certificate
active
07625821
ABSTRACT:
The present invention provides system and apparatus for use in processing wafers. The new system and apparatus allows for the production of thinner wafers that at same time remain strong. As a result, the wafers produced by the present process are less susceptible to breaking. The unique system also offers an improved structure for handling thinned wafers and reduces the number of processing steps. This results in improved yields and improved process efficiency.
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Dolechek Kert L.
Thompson Raymon F.
Bohn Craig E.
Gargano Jeffrey R.
McDermott & Will & Emery
Sarkar Asok K
Semitool Inc.
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