Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1992-03-17
1993-08-03
Strecker, Gerard R.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324158R, G01R 2726
Patent
active
052333078
ABSTRACT:
During a first period, the capacitive system to be qualified is polarized so as to be in the initial state (which can be accumulation or inversion in the case of a capacitive MIS semiconductor system). During a second period, the system is polarized so as to be in the depletion state with constant capacitance. As from a determined instant during the second period, the capacitive value of the system is recorded. This value serves as a reference for the servocontrol of the variation of the polarization voltage maintaining the capacitive system in the depletion state. The measurement of the servocontrol voltage makes it possible to obtain the desired qualification.
REFERENCES:
patent: 3824459 (1974-07-01), Uchida
patent: 3882391 (1975-05-01), Liles et al.
patent: 4323842 (1982-04-01), McGarrity et al.
patent: 4509012 (1985-04-01), Lin
patent: 5027064 (1991-06-01), Cripps
"A Modified Linear Sweep Tachnique for MOS-C Generation Rate Measurements", Pierret and Small, IEEE Transations on Electron Devices vol. ED-22 No. 11, Nov. 1975 (New York, N.Y.).
"A Computer Controlled System for Transient Capacitance Measurements of Deep Levels in Semiconductors", Woon et al., IEEE Transations on Instrumentation & Measurement, vol. 37, No. 1, Mar. 1988, New York, N.Y.
Pelloie Jean-Luc
Toffoli Alain
Commissariat a l''Energie Atomique
Regan Maura K.
Strecker Gerard R.
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