Process and apparatus for the growth of films of silicides of re

Coating processes – Electrical product produced – Integrated circuit – printed circuit – or circuit board

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427 99, 427294, 427255, 4272554, 4272555, 134 2, 134 3, H01L 21285

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046439145

ABSTRACT:
Process and apparatus for the growth of films of silicides of refractory metals and films obtained by this process.
According to the invention, in order to grow a silicide film of a refractory metal on a silicon substrate, the latter is cleaned, then thermally degassed under an ultra-high vacuum by bringing the substrate to a given temperature between approximately 600.degree. C. and approximately 800.degree. C. A refractory metal is then evaporated on to the substrate at said temperature, after which the temperature is progressively lowered.
Application to the production of electronic microcomponents.

REFERENCES:
C. J. Kircher et al, "Interconnection Method for Integrated Circuits", IBM Tech. Disc. Bul., vol. 13, No. 2, Jul. 1970.
Article by J. C. Bean, published in IEDM 81, pp. 6 to 13, IEEE.
Article by K. Y. Ahn et al., published in Thin Solid Films, vol. 118, No. 2, 10.8, 1984, pp. 163 to 170.
Article by R. D. Thompson et al., published in Thin Solid Films, vol. 93, No. 3/4, Jul. 1982, pp. 265 to 274.

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