Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Patent
1998-01-20
1999-12-21
Do, Diep N.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
For fault location
324537, 324754, G01R 3102
Patent
active
060053941
ABSTRACT:
The accuracy of a capacitive testing procedure is improved by adjusting the ideal values against which comparisons are made during the testing process, for all of the circuit elements (e.g., pin connections) being tested, responsive to cumulative deviations of the measured values from their anticipated ideal values. This can be accomplished by initially comparing all of the capacitance measurements taken for a given printed circuit to their ideal values, and calculating a deviation for each of the comparisons made. Following the testing of an entire printed circuit, the resulting series of calculated deviations are tabulated and averaged, and the resulting average deviation is then added to or subtracted from the tabulated readings for each of the circuit elements before any true defects are identified for the printed circuit being tested. In this way, all of the parts being tested are brought to the same baseline, eliminating overall reference differences (i.e., between different panels).
REFERENCES:
patent: 3975680 (1976-08-01), Webb
patent: 4565966 (1986-01-01), Burr et al.
patent: 5006808 (1991-04-01), Watts
patent: 5256975 (1993-10-01), Mellitz et al.
patent: 5363048 (1994-11-01), Modlin et al.
patent: 5391993 (1995-02-01), Khazam et al.
patent: 5744964 (1998-04-01), Sudo et al.
IBM Technical Disclosure Bulletin vol. 39, No. 09, (Sep. 1996), p. 111.
IBM Technical Disclosure Bulletin vol. 38, No. 06, (Jun. 1995), pp. 549,550.
IBM Technical Disclosure Bulletin vol. 38, No. 06, (Jun. 1995), pp. 507-508.
IBM Technical Disclosure Bulletin vol. 28, No. 7, (Dec. 1985), pp. 2849-2851.
Majka Christopher J.
Seward Matthew F.
Do Diep N.
International Business Machines - Corporation
Pivnichny John R.
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