Process and apparatus for recrystallization of semiconductor lay

Fishing – trapping – and vermin destroying

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117 44, 117933, C30B 108

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053225899

ABSTRACT:
A process for recrystallizing a semiconductor layer including the steps of forming a polycrystalline or amorphous semiconductor layer on a substrate and scanning energy beam on the semiconductor layer, wherein the energy beam is vibrated substantially in parallel to the direction of advance of the scanning of the energy beam. For carrying out the process, the apparatus includes a sample stage for holding a sample having a polycrystalline or amorphous semiconductor layer, an energy beam source for generating energy beam, a scanning means for scanning the energy beam on the semiconductor layer, and a beam-vibrating means for vibrating the energy beam substantially in parallel to the direction of advance of the scanning of the energy beam.

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Heteroepitaxy Of Deposited Amorphous Layer By Pulsed Electron-Beam Irradiation; Lau et al; pp. 235-237.
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Journal of the Electrochemical Society, vol. 133, No. 7, Jul. 1986, pp. 1485-1488, Sakurai, "Focused lamp zone melting recrystallization of silicon on insulating substrates".

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