Process and apparatus for measuring wave surface distortions int

Details Process and apparatus for measuring wave surface distortions int Process and apparatus for measuring wave surface distortions int

1982-11-05

1985-12-17

Rosenberger, R. A.

Optics: measuring and testing

Lens or reflective image former testing

For optical transfer function

3561245, 356349, G01M 1102, G01M 1100

Patent

active

045589488

ABSTRACT:
The invention relates to an apparatus for measuring the wave surface distortions introduced by a lens, comprising a source which emits coherent light of frequency .nu.o; means for creating a reference beam and a measuring beam; a Bragg cell receiving and transmitting said beams, excited by a radio-frequency wave of frequency f emitted by a generator, the reference beam transmitted having the frequency .nu.o and the measuring beam diffracted by the cell having a frequency .nu.o+f; means for transmitting the beams from the cell to the lens to be tested; detection means transforming the light signal from the lens into an electrical signal of frequency f and whereof the phase is characteristic of the wave surface distortions introduced by the lens; and means for measuring the phase displacement between the phase of the electrical signal from the detection means and the phase of an electrical signal corresponding to the radio-frequency waves.

REFERENCES:
patent: 3447874 (1969-06-01), Back
patent: 3744039 (1973-07-01), Hrbek
patent: 3930732 (1976-01-01), Holly
patent: 4299490 (1981-11-01), Cahill et al.
patent: 4326778 (1982-04-01), Berg et al.
"Cube Corner Retroflector Test and Analysis", Zurasky, Applied Optics, Feb. 1976, p. 445.

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