Measuring and testing – Gas analysis – Moisture content or vapor pressure
Patent
1996-11-25
1998-08-18
Williams, Hezron E.
Measuring and testing
Gas analysis
Moisture content or vapor pressure
7333504, 7333505, 324439, 324694, 324 771, 204147, 2041531, G01N 2702, G01W 0111, C23F 1300
Patent
active
057959943
ABSTRACT:
Condensed moisture in devices and/or pipe conduits for anti-corrosion applications in chemical engineering is measured at least one point in the devices and/or pipe conduits by measuring an electrochemical potential difference across two different elements, such as iron and copper, which are arranged one beside the other spaced from 0.001 to 1 mm from each other by an electrically insulating material so as to be electrically insulated from each other. An apparatus for making these measurements is also described.
REFERENCES:
patent: 3857284 (1974-12-01), Carron et al.
patent: 4011538 (1977-03-01), Froemel
patent: 4052667 (1977-10-01), Schwartz
patent: 4227411 (1980-10-01), Abramovich
patent: 4266195 (1981-05-01), Keefner et al.
patent: 4795539 (1989-01-01), Bianchi et al.
patent: 4933669 (1990-06-01), Lyons
patent: 5097212 (1992-03-01), Carlon et al.
patent: 5137991 (1992-08-01), Epstein et al.
patent: 5164675 (1992-11-01), Howe et al.
patent: 5343735 (1994-09-01), Succi et al.
Kalfa Horst
Schroeder Knut
Metallgesellschaft Aktienegesellschaft
Striker Michael J.
Wiggins J. David
Williams Hezron E.
LandOfFree
Process and apparatus for measuring condensed moisture and appli does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Process and apparatus for measuring condensed moisture and appli, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process and apparatus for measuring condensed moisture and appli will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1115905