Process and apparatus for locating short-circuits in multi-layer

Details Process and apparatus for locating short-circuits in multi-layer Process and apparatus for locating short-circuits in multi-layer

1974-02-07

1976-11-16

Strecker, Gerard R.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Frequency of cyclic current or voltage

324 73PC, G01R 3108

Patent

active

039926630

ABSTRACT:
Method and apparatus for locating shot-circuis in multi-layer circuit boards which comprise applying a detectable signal between conductors on the circuit boards which should be insulated from each other and utilizing a movable probe capable of detecting the detectable signal which exists between the conductors when a fault such as a short circuit exists between them. By moving the probe over various areas of the circuit boards, the particular physical location of the fault can be determined. The probe may be manually moved or moved with a scanning mechanism.

REFERENCES:
patent: 3247453 (1966-04-01), Quittner
patent: 3274489 (1966-09-01), Behr
patent: 3303400 (1967-02-01), Allison
patent: 3441842 (1969-04-01), Sturm
patent: 3621384 (1971-11-01), Yamada
patent: 3725779 (1973-04-01), Mauer

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