Process and a circuit board for performing tests during burn-in

Details Process and a circuit board for performing tests during burn-in Process and a circuit board for performing tests during burn-in

1988-04-21

1990-07-31

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Plural, automatically sequential tests

324158F, G01R 3110

Patent

active

049453025

ABSTRACT:
A process for the burn-in of either or both analog and digital integrated circuits where the various functions in the individual circuits are tested continuously and individually, while the circuits are cyclically caused to work at extreme temperatures, and the test is stopped when a predetermined error rate has been reached. To perform the process, a circuit board comprises, in addition to the circuits tested at intermittent elevated temperatures, also auxiliary circuits for data collection and data compaction, said circuits being present at a constant normal working temperature during the burn-in sequence.

REFERENCES:
patent: 3609547 (1971-09-01), Slusser
patent: 3842346 (1974-10-01), Bobbit
patent: 4374317 (1983-02-01), Bradshaw
patent: 4379259 (1983-04-01), Varadi et al.
patent: 4468616 (1984-08-01), Yoshizaki
patent: 4542341 (1985-09-01), Santomango et al.
patent: 4749947 (1988-06-01), Gheewala
Bruder et al., Carrier Assembly for Component Aging 8/71 IBM Technical Disclosure Bulletin vol. 14 No. 3 p. 737.

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