Process and a circuit arrangement for evaluating a measuring...

Details Process and a circuit arrangement for evaluating a measuring... Process and a circuit arrangement for evaluating a measuring...

2006-12-05

2006-12-05

Deb, Anjan (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S664000, C324S686000, C324S689000, C324S658000, C324S665000

Reexamination Certificate

active

07145350

ABSTRACT:
A process is disclosed for evaluating a measuring device comprising a capacitor (CM), with stages for charging the capacitor (CM) over an initial charging period (tk1, tk2) and for determining the capacitance charge as an initial measured value (tml). To determine a measuring condition that changes a normal state of the capacitance, e.g., moist as opposed to dry surroundings for the measuring cell, the process exhibits the following additional steps: charging the capacitance (CM) over a second charging period (tk2), which differs from the first charging period (tk1); determining the charge of the capacitance (CM) as a second measured value (tm2); and comparing the first and second measured values (tk1, tk2) to establish the comparative result.

REFERENCES:
patent: 5150059 (1992-09-01), Bognar et al.
patent: 5461321 (1995-10-01), Sanders et al.
patent: 6020744 (2000-02-01), Ghorashi et al.
patent: 6191723 (2001-02-01), Lewis
patent: 6250152 (2001-06-01), Klein et al.
patent: 6509746 (2003-01-01), Wang
patent: 6731121 (2004-05-01), Hsu et al.
patent: 6768319 (2004-07-01), Wang
patent: 6853201 (2005-02-01), Hirn et al.
patent: 1041457 (1990-04-01), None
patent: 1111355 (1995-11-01), None
patent: 1266494 (2000-09-01), None
patent: 42 22 788 (1994-01-01), None
patent: 43 40 472 (1995-04-01), None
patent: 4340472 (1995-04-01), None
patent: 10028353 (2001-12-01), None
patent: 1 411 349 (2004-04-01), None
patent: WO 01/04648 (2001-01-01), None

Affiliated with

Also associated with

Rating

Process and a circuit arrangement for evaluating a measuring... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Process and a circuit arrangement for evaluating a measuring..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process and a circuit arrangement for evaluating a measuring... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3657247