Data processing: measuring – calibrating – or testing – Calibration or correction system – Linearization of measurement
Reexamination Certificate
2006-10-03
2006-10-03
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Linearization of measurement
C700S054000, C702S105000, C703S006000
Reexamination Certificate
active
07117109
ABSTRACT:
A method for processing measuring data and a device to perform the method, wherein the measuring data can be determined by using a measurement system, more particularly a chromatographic analyzing system, for the measurement of measuring values that correspond to certain information about, or of, a technical process and that depend on at least two variables.
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patent: WO 93/21592 (1993-10-01), None
Agilent Technologie,s Inc.
Bui Bryan
Le John
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