Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-08-22
2006-08-22
Tsai, Carol S. W. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S188000, C370S516000, C370S517000, C708S207000
Reexamination Certificate
active
07096132
ABSTRACT:
A method of and system for estimating a parameter of a local maxima or minima of a function. An interpolated local maxima or minima is determined. An interpolation offset is then derived, comprising a deviation between locations of the interpolated and sampled local maxima or minima of the function. An estimate of the parameter is derived from the interpolation offset.
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Patrick Christopher
Rowitch Douglas
Greenhaus Bruce
McFarland James
Qualcomm Incorporated
Tsai Carol S. W.
Wadsworth Philip
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