Probing method, probe apparatus and storage medium

Details Probing method, probe apparatus and storage medium Probing method, probe apparatus and storage medium

2008-03-17

2009-12-01

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090

Reexamination Certificate

active

07626406

ABSTRACT:
A probing method measures electrical characteristics of an object to be inspected by bringing a probe needle to make a contact with an electrode pad of the object, the probe needle formed to be vertically pointing the object. The method includes the steps of: mounting the object on a mounting table; aligning the object and the probe needle; thereafter, contacting the probe needle with the electrode pad by moving the mounting table upwards, and then moving the mounting table vertically upwards while moving same horizontally to rend an oxide film formed on a surface of the electrode pad, so that a tip of the probe needle is stuck into the electrode pad and the probe needle and the electrode pad to conduct with each other.

REFERENCES:
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patent: 6433571 (2002-08-01), Montoya
patent: 6933737 (2005-08-01), Sugawara
patent: 2004/0046580 (2004-03-01), Takemoto et al.
patent: 2004/0239352 (2004-12-01), Mizoguchi

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