Probing high-frequency signals

Details Probing high-frequency signals Probing high-frequency signals

2008-05-27

2008-05-27

Hirshfeld, Andrew H. (Department: 2858)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Analysis of complex waves

C324S754090, C702S191000

Reexamination Certificate

active

07378832

ABSTRACT:
Apparatus and associated systems and methods may relate to a wide bandwidth cable assembly that may include an active amplification stage to receive high frequency signals (e.g., 1 GHz or above) through a transmission line extending distally to a passive, high density signal probe stage. In an illustrative example, the probe stage may receive multiple analog or digital signals from a device under test (DUT). In some embodiments, the probe stage may include probe pins with integrated series resistance to control signal loading, and an equalizer to shape the signal path's frequency response. The amplification stage may provide a virtual ground reference for a termination impedance that may match the transmission line's impedance and may connect in series with a feedback impedance. In one example, a minimally invasive probe head may facilitate measurement of multiple channels of a high speed data bus with minimal signal distortion and/or attenuation.

REFERENCES:
patent: 3569869 (1971-03-01), Sutton et al.
patent: 4484792 (1984-11-01), Tengler et al.
patent: 4494082 (1985-01-01), Bennett
patent: 4586769 (1986-05-01), Tengler et al.
patent: 5274336 (1993-12-01), Crook et al.
patent: 5493259 (1996-02-01), Blalock et al.
patent: 5770974 (1998-06-01), Vogt et al.
patent: 6566854 (2003-05-01), Hagmann et al.
patent: 6606583 (2003-08-01), Sternberg et al.
patent: 6650131 (2003-11-01), Campbell et al.
patent: 6686754 (2004-02-01), Miller
patent: 6778602 (2004-08-01), Agazzi et al.
patent: 6809539 (2004-10-01), Wada et al.
patent: 6836159 (2004-12-01), Wodnicki
patent: 6863576 (2005-03-01), Campbell et al.
patent: 6952053 (2005-10-01), Huang et al.
patent: 7030657 (2006-04-01), Stojanovic et al.
patent: 7050388 (2006-05-01), Kim et al.
patent: 7292044 (2007-11-01), Frame
patent: 2004/0183211 (2004-09-01), Alcoe et al.
patent: 2007/0268012 (2007-11-01), Kawabata
PETracer ML Mid-Bus Probe Installation Guide, Manual Version 1.30, Feb. 2005.
http://www.rogerscorporation.com/acm/about—our—products.htm#5870, Aug. 14, 2004.
http://www.rogerscorporation.com/acm/about—our—products.htm#RO4000, Aug. 14, 2004.
http://www.taconic-add.com/pdf/taconic-laminate—material—guide.pdf, Apr. 2006.
http://www.analog.com/en/prod/0,,759—786—AD8000%2C00.html, Feb. 2005.
http://www.analog.com/en/prod/0,,759—842—AD8352%2C00.html, Feb. 2006.
http://www.national.com/pf/LM/LMH6624.html, information as of Aug. 22, 2006.
PCI Express PETracer GEN2 Summit—LeCroy, Jul. 25, 2006.
Overcoming signal integrity issues with wideband crosstalk cancellation technology (M. Vrazel, A. Kim), Design Con 2006, Santa Clara, CA, Feb. 2006.
H. Johnson et al., “High-speed signal propagation: advanced black magic,” Textbook, Chapters 8,9, and 11, pp. 277-331, 333-400 and 471-549, published 2003.
Eric Bogatin, Signal Integrity—Simplified, Textbook, Chapter 6, pp. 363-438, published 2003.

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