Probing adapter for testing IC packages

Details Probing adapter for testing IC packages Probing adapter for testing IC packages

1996-01-16

1997-07-08

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324765, H01H 3102

Patent

active

056465424

ABSTRACT:
A probe adapter providing the capability to test integrated circuit (IC) packages is presented. The probe adapter comprises a mechanical assembly and a probe wire assembly. The mechanical assembly houses the probe wire assembly and facilitates attachment of the probe adapter to the IC under test. The mechanical assembly also ensures correct alignment of the probe wire assembly with the leads of the IC package. The mechanical assembly comprises an alignment member, a guide, a frame and an adapter printed circuit board (PCB). The probe wire assembly comprises a plurality of probe wires, the plurality of probe wires being placed into a plurality of apertures along the perimeter of the guide. One end of the probe wire is placed into electrical contact with a IC package lead, the other end being electrically attached to a tester via the adapter PCB.

REFERENCES:
patent: 4112363 (1978-09-01), Morrison et al.
patent: 4996476 (1991-02-01), Balyasny
patent: 5033977 (1991-07-01), Ignasiak
patent: 5049813 (1991-09-01), Loan et al.
patent: 5221209 (1993-06-01), D'Amico
patent: 5323106 (1994-06-01), Saegusa
patent: 5347215 (1994-09-01), Armstrong et al.

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